Two Days Workshop on Materials Testing and Characterization 2018, NIT Tiruchirappalli, Workshop, Tiruchirappalli, Tamil Nadu, 14th - 15th December 2018

  • Category: Workshop
  • Start Date: 14th December 2018
  • End Date: 15th December 2018
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Two Days Workshop on Materials Testing and Characterization 2018

Description

Research Scholars Forum

Events

14/12/2018
Day 1
10:30 AM -12:00 PM,NDT Techniques
Dr.D. Sastikumar,
Professor,
NIT, Trichy

1:00 PM – 2:30 PM Mechanical Testing
Dr P. Chakravarthy,
Associate Professor,
IIST, Trivandrum

3:00 PM – 4:30 PM DEMONSTRATION ON TESTING METHODS

15/12/2018
Day 2
9:00 AM -10:30 AM
Scanning Electron
Microscope
Dr.Vinoadh Krishnan,
Post-Doctoral Fellow,
IISc, Bangalore.

11:00 AM -12:30 PM
Transmission Electron
Microscope
Dr. C.V. Sai Kiran,
Scientist,
VSSC-ISRO
Bangalore.

1:30 PM – 3:00 PM X-Ray Diffraction
Dr.Vinoadh Krishnan,
Post-Doctoral Fellow,
IISc, Bangalore.

3:30 PM – 5:00 PM DEMONSTRATION ON MICROSCOPY

Fest Guests

Dr. C. Venkata Sai Kiran, Scientist,
Indian Space Research Organisation, Trivandrum.
Electron Microscopy and Spectroscopy, Advanced Transmission Electron Microscopy and Spectroscopy, In situ TEM, Electron Tomography of Nanocomposites.

Dr. D. Sastikumar, Professor,
National Institute of Technology,Trichy.
Types of basic NDT methods, Purpose and limitations, Concepts, operating principles, Recent Developments.
Purpose and importance of destructive tests – Concepts, and method of Tensile, hardness, bend testing with exploration.

Dr. P. Chakravarthy, Associate Professor,
Indian Institute of Space Science and Technology,
Trivandrum.
Light microscopy, basic principles and special Techniques, metallographic Examination with best practice, understanding, interpretation and analyze the microstructure of materials

Dr. Vinoadh Kumar Krishnan,
Post Doctorial Research Associate,
Indian Institute of Science, Bangalore.
X-rays and X-ray Techniques (overview), Basic Analysis, Rietveld refinement
SEM- Electron Specimen Interaction, Influence on Images of Operational Technique, Specimen Preparation Technique, Characterization through EDAX, EBSD, FIB, Tilting Experiments

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